Temperature Dependence of Structure, Dielectric and Energy Storage Properties in Bi 3.15 Nd 0.85 Ti 3 O 12 Thin Films-Reference-Cited by-同舟云学术

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Temperature Dependence of Structure, Dielectric and Energy Storage Properties in Bi _3.15 Nd _0.85 Ti ₃ O ₁₂ Thin Films

Published:2023-09-02 Issue:1 Volume:237 Page:11-20
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Zhao Zengcai¹,Fan Qiaolan¹,Yin Chunfeng¹,Lu Yaping¹,Jin Yuzhu¹,Zhou Yangxin¹

Affiliation:

1. School of Science, Hangzhou Dianzi University, Hangzhou, China

Funder

Zhejiang Provincial Natural Science Foundation

Fundamental Research Funds for the Provincial Universities of Zhejiang

Scientific Research Foundation of Hangzhou Dianzi University

Publisher

Informa UK Limited

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584587.2023.2227046

Reference25 articles.

1. Nanoscale doping and its impact on the ferroelectric and piezoelectric properties of Hf0.5Zr0.5O2;Anastasia C.;Nanomaterials,2022

2. Millimeter-wave reflector based on a ferroelectric material with electrical beam steering;Roman P.;Crystals,2021

3. Molecular ferroelectric-based flexible sensors exhibiting supersensitivity and multimodal capability for detection;Wenru L.;Adv. Mater.,2021

4. Imperceptible energy harvesting device and biomedical sensor based on ultraflexible ferroelectric transducers and organic diodes;Andreas P.;Nat. Commun.,2021

5. Experimental determination of the maximum post-process annealing temperature for standard CMOS wafers;Sedky S.;IEEE Trans. Electron Devices,2001

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