Optical constants of SiO2 from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO2 on Eagle XG® glass by spectroscopic ellipsometry-Reference-Cited by-同舟云学术

Optical constants of SiO2 from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO2 on Eagle XG® glass by spectroscopic ellipsometry

Published:2017-12 Issue:2 Volume:24 Page:026002
ISSN:1055-5269
Container-title:Surface Science Spectra
language:en
Short-container-title:Surf. Sci. Spectra

Author:

Johnson Brian I.¹,Cushman Cody V.¹,Rowley Joseph²,Lunt Barry M.³,Smith Nicholas J.⁴,Martin Andrew⁵,Linford Matthew R.¹

Affiliation:

1. Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602

2. Department of Physics and Astronomy, Brigham Young University, N283 ESC, Provo, Utah 84602

3. Department of Information Technology, Brigham Young University, 265 CTB, Provo, Utah 84602

4. Science and Technology Division, Corning Incorporated, SP-FR-02-10, Corning, New York 14831

5. J. A. Woollam Co., Inc., 645 M Street, Suite 102, Lincoln, Nebraska 68508

Funder

Corning Inc.

Moxtek Inc.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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