Microprobe Reflection High-Energy Electron Diffraction
Author:
Ichikawa Masakazu
Publisher
Springer Singapore
Reference8 articles.
1. Ichikawa, M., Doi, T., Hayakawa, K.: Observation of Si(111) and gold-deposited Si(111) surfaces using microprobe reflection high-energy electron diffraction. Surf. Sci. 159, 133–148 (1985) 2. Watanabe, H., Kato, K., Uda, T., Fujita, K., Ichikawa, M., Kawamura, T., Terakura, K.: Kinetics of initial layer-by-layer oxidation of Si(001) surfaces. Phys. Rev. Lett. 80, 345–348 (1998) 3. Watanabe, H., Ichikawa, M.: Development of a multifunctional surface analysis system based on a nanometer scale scanning electron beam: combination of ultrahigh vacuum-scanning electron microscopy, scanning reflection electron microscopy, Auger electron spectroscopy, and x-ray photoelectron spectroscopy. Rev. Sci. Instrum. 67, 4185–4190 (1996) 4. Maruno, S., Fujita, S., Watanabe, H., Kusumi, Y., Ichikawa, M.: A combined apparatus of scanning reflection electron microscope and scanning tunneling microscope. Rev. Sci. Instrum. 68, 116–119 (1997) 5. Shklyaev, A., Shibata, M., Ichikawa, M.: Nanometer-scale germanium islands on Si(111) surface windows formed in an ultrathin silicon dioxide film. Appl. Phys. Lett. 72, 320–322 (1998)
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