Optical Constants of BiI3 Polycrystalline Thin Films with Potential Applications in X-ray Detectors and Photovoltaic Cell
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Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-5971-3_13
Reference14 articles.
1. Owen A, Peacock A (2004) Compound semiconductor in radiation detectors. Nucl Ins Methods A53:18–37
2. Garg A, Tomar M, Gupta V (2014) Structural optical and electrical properties of thin films of BiI3. Adv Sci Lett 20:1442–1445
3. Shabaan ER, Afify N, Taher AEl, (2009) Effect of film thickness on microstructure parameters and optical constants. J Alloys Compds 482:400–404
4. Swanepoel R (1983) J Phys Sci Instrument 16:1214
5. Manifacier JC, Gaslot J, Fillard JP (1976) A simple method for the determination of the optical constants n, K and thickness of a weekly absorbing thin film. J Phys E: Sci Instrum 9:1002
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1. Effect of annealing on photo-physical properties of BiI3 thin films via vacuum thermal evaporation deposition for photovoltaic applications;The European Physical Journal Applied Physics;2023
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