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Confocal optical beam induced current microscopy of light-emitting diodes with a white-light supercontinuum source

  • Published:2007-08-22 Issue:4 Volume:88 Page:551-555
  • ISSN:0946-2171
  • Container-title:Applied Physics B
  • language:en
  • Short-container-title:Appl. Phys. B

Author:

Esposito E.,Kao Fu-Jen,McConnell G.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Facile construction of a laser scanning optical beam induced current microscope;IEEE Photonics Journal;2024

2. An insight into optical beam induced current microscopy: Concepts and applications;Microscopy Research and Technique;2022-08-03

3. Polychromatic angle resolved IBIC analysis of silicon power diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-02

4. Optical beam induced current microscopy of photonic quantum ring lasers;Applied Physics B;2011-03-01

5. Detection and Localization of Defects in Monocrystalline Silicon Solar Cell;Advances in Optical Technologies;2010-05-30
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