Epitaxial Growth of Alpha Gallium Oxide Thin Films on Sapphire Substrates for Electronic and Optoelectronic Devices: Progress and Perspective
Author:
Funder
Korea Evaluation Institute of Industrial Technology
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
https://link.springer.com/content/pdf/10.1007/s13391-021-00333-5.pdf
Reference116 articles.
1. Reese, S.B., Remo, T., Green, J., Zakutayev, A.: How much will gallium oxide power electronics cost? Joule 3, 903–907 (2019)
2. Yoon, D.-H., Reimanis, I.E.: A review on the joining of SiC for high-temperature applications. J. Korean Ceram. Soc. 57, 246–270 (2020)
3. Ha, M. T., Shin, Y. J., Bae, S. Y., Park, S. Y., Jeong, S. M. Effect of hot-zone aperture on the growth behavior of SiC single crystal produced via top-seeded solution growth method. J. Korean Ceram. Soc. 56, 589–595 (2019)
4. Jones, E.A., Wang, F.F., Costinett, D.: Review of commercial GaN power devices and GaN-based converter design challenges. IEEE J. Emerg. Selected Top. Pow. Electron. 4, 707–719 (2016)
5. Shah, F.M., Maqsood, S., Damaševičius, R., Blažauskas, T.: Disturbance rejection and control design of MVDC converter with evaluation of power loss and efficiency comparison of SiC and Si based power devices. Electronics 9, 1878 (2020)
Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Low-dimensional halide perovskites for advanced electronics;Materials Today Electronics;2024-09
2. High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam;Crystals;2024-08-14
3. Impact of temperature and film thickness on α- and β- phase formation in Ga2O3 thin films grown on a-plane sapphire substrate;Thin Solid Films;2024-08
4. Charge Neutral Point Shift of a 700 nm-Thick α-Ga2O3 Thin-Film Detector under Soft X-ray Irradiation;ACS Applied Electronic Materials;2024-07-26
5. Temperature-dependent epitaxial evolution of carbon-free corundum α-Ga2O3 on sapphire;Journal of Physics D: Applied Physics;2024-06-04
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3