Introduction to X-Ray Absorption Spectroscopy and Its Applications in Material Science
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-92955-2_13
Reference73 articles.
1. de Groot, F., & Kotani, A. (2008). Core level spectroscopy of solids. Boca Raton: CRC Press.
2. Bunker, G. (2010). Introduction to XAFS. Cambridge: Cambridge University Press, UK.
3. Newville, M. (2014). Reviews in Mineralogy and Geochemistry, 78, 33–74.
4. Schnohr, C. S., & Ridgway, M. C. (2015). X-ray absorption spectroscopy of semiconductors. Springer series in optical sciences. Springer-Verlag Berlin Heidelberg.
5. Sharma, A., Varshney, M., Shin, H. J., Lee, B. H., Chae, K. H., & Won, S. O. (2017). Materials Chemistry and Physics, 191, 129.
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