Correction: Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method
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Published:2024-03
Issue:8
Volume:35
Page:
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ISSN:0957-4522
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Container-title:Journal of Materials Science: Materials in Electronics
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language:en
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Short-container-title:J Mater Sci: Mater Electron
Author:
Güçlü Ç. Ş.ORCID,
Tanrıkulu E. Erbilen,
Ulusoy M.,
Azizian-Kalandaragh Yashar,
Altındal Ş.
Publisher
Springer Science and Business Media LLC